Photothermal Imaging of Individual Nano-Objects with Large Scattering Cross Sections

Photothermal (PT) microscopy enables the efficient detection of absorbing nano-objects with high sensitivity and stability. The PT signal in the current PT microscopy usually comes from the interaction of the probe laser beam with the heating laser beam-induced thermal lens, and the contribution of the scattering field from the imaged nano-object is usually not taken into account. Here, in this paper, we systematically studied the influence of the scattering field from the imaged nanoparticles on the obtained PT signal by using Ag nanowires (NWs) on a glass substrate surrounded by glycerol as an example. Under the excitation of a heating laser beam at 532 nm wavelength, the rise of local temperature around the Ag NW results in the intensity variation of the interferometric scattering probe light at 730 nm wavelength which includes the scattering light from the Ag NW and the reflection light from the glass-glycerol interface. We found that the PT signal on the NW are positive and negative for the probe beam polarized parallel and perpendicular to the NW axis, respectively. Numerical simulations confirm that the heat-induced intensity variation of the pure scattering light from the NW and the thermal lens-induced intensity increase of the reflection light both contribute to the obtained PT signal. Our work provides the basic guidance for the analysis of PT signal from nano-objects with large scattering cross sections.