Automatic bad channel detection in implantable brain-computer interfaces using multimodal features based on local

Mengmeng Li1, You Liang1, Lifang Yang1

  • 1School of Electrical Engineering, Zhengzhou University, Zhengzhou, Henan, China; Industrial Technology Research Institute, Zhengzhou University, Zhengzhou, Henan, China.

Summary

This study introduces a machine learning method to automatically detect faulty channels in neural recordings using combined local field potential (LFP) and spike signal features. The approach enhances data quality for large-scale neural signal analysis.

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