Crystal symmetry determination in electron diffraction using machine learning
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Updated: Dec 29, 2025

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
Published on: April 24, 2018
Kevin Kaufmann1, Chaoyi Zhu2, Alexander S Rosengarten1
1Department of NanoEngineering, University of California, San Diego, La Jolla, CA 92093, USA.
Abstract:
Electron backscatter diffraction (EBSD) is one of the primary tools for crystal structure determination. However, this method requires human input to select potential phases for Hough-based or dictionary pattern matching and is not well suited for phase identification. Automated phase identification is the first step in making EBSD into a high-throughput technique. We used a machine learning-based approach and developed a general methodology for rapid and autonomous identification of the crystal symmetry from EBSD patterns. We evaluated our algorithm with diffraction patterns from materials outside the training set. The neural network assigned importance to the same symmetry features that a crystallographer would use for structure identification.
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