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Rapid polarization mapping in ferroelectrics using Fourier masking.

K Moore1, M Conroy1, U Bangert1

  • 1Department of Physics, Bernal Institute, University of Limerick, Limerick, Ireland.

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|February 12, 2020
PubMed
Summary

This study presents a fast Fourier masking technique for rapid polarization mapping in ferroelectric materials using transmission electron microscopy. This method streamlines the analysis of ferroelectric domain structures, accelerating research in advanced materials.

Keywords:
Domain wallFerroelectricLead titanatePolarisation mappingSTEMSingle crystal

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Electron Microscopy

Background:

  • Ferroelectric domain walls (DWs) exhibit novel physical phenomena due to nanoscale polarization discontinuities.
  • Characterizing polarization in ferroelectric materials using transmission electron microscopy (TEM) is crucial but often time-consuming.
  • Existing methods for polarization mapping can be sensitive to experimental conditions like zone axis and local strain.

Purpose of the Study:

  • To introduce a fast and broadly applicable method for polarization mapping in ferroelectric materials via TEM.
  • To demonstrate the technique's effectiveness in analyzing ferroelectric domain structures, specifically in lead titanate (PTO).
  • To provide a streamlined analysis tool for electron microscopists studying ferroelectric samples.

Main Methods:

  • Developed a polarization mapping technique utilizing Fourier masking on high-resolution TEM or STEM images.
  • Leveraged the coupling between polarization and spontaneous strain to isolate strain states and map domain structures.
  • The method requires only standard TEM/STEM imaging capabilities and is less sensitive to zone axis or local strain effects.

Main Results:

  • Successfully demonstrated fast mapping of the domain structure in ferroelectric lead titanate (PTO) using Fourier masking.
  • The technique proved to be rapid, taking approximately two minutes per sample analysis.
  • The method is robust, showing reduced sensitivity to zone axis and local strain compared to other techniques.

Conclusions:

  • Fourier masked polarization mapping is an efficient and versatile tool for analyzing ferroelectric domain structures in TEM.
  • The technique's speed and ease of application make it suitable for in-situ experiments and routine analysis.
  • This method will significantly streamline the process of identifying and analyzing ferroelectric domain features in electron microscopy.