Spectroscopy and Optimizing Semiconductor Detector Data Under X and γ Photons Using Image Processing Technique

Spectroscopy is the study of the absorption and emission of light or other radiation by material. It is used to measure intensity of radiation by a function of wavelength.

The spectra of semiconductor detector cadmium tungstate from water, iron, lead, aluminum, and soft tissue targets were experimentally obtained through incident 1E-3 GeV X-ray and ⁶⁰Co γ-ray and then optimized. The amounts of transmitting radiation attenuation were calculated in 0.2-2 cm thicknesses of the materials using reduction coefficient in theory. Data obtained from FLUKA's simulations were then compared with theoretical values by dividing per theoretical parameter, and mean values were obtained for the attenuation coefficients. Finally, by using the MATLAB software, these corrected coefficients were applied to the simulated data, and the spectra were replotted to optimize the detected values.

These obtained parameters increased while the material density increased, except for water and soft tissue materials under γ-ray of ⁶⁰Co. The multiple Compton scattering inside the low-density material affected the γ-photon deviation to reach the crystal. Also, iron had the lowest values of mass attenuation coefficient for both incident radiations, causing a great corrected coefficient and then a greater count in redrawing.

Although the lead material had the greatest density and X-attenuation coefficient, it revealed large amounts for both corrected coefficients, X and γ rays, of 100.90848 and 1.90900, respectively. In count estimation, results showed that the simulated spectra after optimization are more similar to practical spectra.

The policy on reducing radiation damage from ionizing particles necessitates evaluation of various material behaviors to determine which one will be instrumental for imaging or radiotherapy concerns.