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Related Concept Videos

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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Scanning Electron Microscopy01:07

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Transmission Electron Microscopy01:15

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In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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Preparation of Samples for Electron Microscopy01:20

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To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
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Electron Microscope Tomography and Single-particle Reconstruction01:07

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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
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Overview of Microscopy Techniques01:22

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments
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Imaging Beam-Sensitive Materials by Electron Microscopy.

Qiaoli Chen1, Christian Dwyer2, Guan Sheng3

  • 1Center for Electron Microscopy, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou, 310014, China.

Advanced Materials (Deerfield Beach, Fla.)
|February 29, 2020
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This summary is machine-generated.

Electron microscopy reveals material structures but can cause damage. This review covers strategies for imaging beam-sensitive materials to understand their properties.

Keywords:
2D materialsMOFsbeam-sensitive materialselectron microscopylow dose

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Area of Science:

  • Materials Science
  • Microscopy

Background:

  • Electron microscopy provides atomic-resolution structural information crucial for materials science.
  • High-energy electrons used in microscopy can damage beam-sensitive materials like MOFs, COFs, and 2D materials.
  • This damage hinders the study of intrinsic structure-property relationships.

Purpose of the Study:

  • To review revolutionary strategies for electron microscopic imaging of beam-sensitive materials.
  • To highlight associated materials science discoveries.
  • To discuss future trends in minimizing electron beam damage.

Main Methods:

  • Review of electron-matter interaction principles.
  • Analysis of electron beam damage mechanisms.
  • Compilation of advanced electron microscopy techniques.

Main Results:

  • Identification of key challenges in imaging beam-sensitive materials.
  • Overview of successful strategies to mitigate electron beam damage.
  • Examples of materials science advancements enabled by these techniques.

Conclusions:

  • Minimizing electron beam damage is essential for accurate characterization of beam-sensitive materials.
  • Novel microscopy strategies are enabling new discoveries in materials science.
  • Continued innovation is needed to further advance imaging capabilities for delicate structures.