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Absolute Structure from Scanning Electron Microscopy.

Ulrich Burkhardt1, Horst Borrmann2, Philip Moll2,3

  • 1Max-Planck-Institut für Chemische Physik fester Stoffe, Dresden, Germany. Ulrich.Burkhardt@cpfs.mpg.de.

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|March 6, 2020
PubMed
Summary
This summary is machine-generated.

Chiral crystal structures, crucial for properties like ferroelectricity, can be challenging to analyze. This study uses X-ray and electron backscatter diffraction (EBSD) to consistently assign chirality in Cobalt-Silicon (CoSi) crystals.

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Area of Science:

  • Solid State Physics
  • Materials Science
  • Crystallography

Background:

  • Chiral and polar crystal structures lack centrosymmetry, enabling key physical properties such as optical birefringence and ferroelectricity.
  • Chirality in materials is linked to advanced phenomena like unconventional superconductivity and magnetic ordering (e.g., skyrmions in B20 structures).
  • Detecting chirality in crystals is often difficult due to overlapping domains with differing absolute structures.

Purpose of the Study:

  • To investigate and consistently assign chirality in high-quality Cobalt-Silicon (CoSi) crystals with B20 structure.
  • To compare the sensitivity and effectiveness of X-ray diffraction and electron backscatter diffraction (EBSD) in chirality detection.
  • To demonstrate the potential of surface-sensitive techniques for analyzing chirality in microstructures.

Main Methods:

  • Utilized complementary X-ray diffraction (volume-sensitive) and electron backscatter diffraction (EBSD) (surface-sensitive) techniques.
  • Investigated high-quality Cobalt-Silicon (CoSi) crystals exhibiting the B20 crystal structure.
  • Analyzed the surface of CoSi crystals containing domains of different chirality.

Main Results:

  • Achieved consistent assignment of chirality in CoSi crystals using both X-ray and EBSD.
  • Revealed fundamental differences in the sensitivity of X-ray and EBSD to chirality.
  • Demonstrated the high spatial resolution of EBSD for analyzing chirality in microstructures, including domains with different chiralities.

Conclusions:

  • X-ray and EBSD provide complementary insights into crystal chirality, with EBSD offering high spatial resolution for surface analysis.
  • The findings highlight the potential of EBSD for characterizing chirality in microscale materials relevant to technological applications.
  • This work advances the understanding and detection of chirality in materials with potential applications in advanced electronics and spintronics.