Scanning Electron Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
Overview of Microscopy Techniques
Overview of Electron Microscopy
Preparation of Samples for Electron Microscopy
Atomic Force Microscopy
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Updated: Dec 27, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Ulrich Burkhardt1, Horst Borrmann2, Philip Moll2,3
1Max-Planck-Institut für Chemische Physik fester Stoffe, Dresden, Germany. Ulrich.Burkhardt@cpfs.mpg.de.
Chiral crystal structures, crucial for properties like ferroelectricity, can be challenging to analyze. This study uses X-ray and electron backscatter diffraction (EBSD) to consistently assign chirality in Cobalt-Silicon (CoSi) crystals.
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