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Updated: May 20, 2026
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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
Dynamical simulation of on-axis transmission Kikuchi and spot diffraction patterns, based on accurate diffraction
Tianbi Zhang1, Raynald Gauvin2, Aimo Winkelmann3,4
1Department of Materials Engineering, The University of British Columbia, Vancouver, British Columbia, Canada.
Journal of Microscopy
|May 19, 2026
Summary
Transmission Kikuchi diffraction (TKD) analysis can be improved by simulating additional diffraction features. This study presents a method for accurate simulation of TKD patterns, enhancing materials characterization.
Area of Science:
- Materials Science
- Crystallography
- Electron Microscopy
Background:
- Transmission Kikuchi diffraction (TKD) is a popular materials characterization technique offering high throughput and nanometer-level spatial resolution.
- Conventional TKD analysis primarily focuses on Kikuchi bands, overlooking other diffraction features like spots and excess-deficiency effects.
- A deeper understanding of the physics and geometry of these additional features is needed for more robust pattern indexing and simulation.
Purpose of the Study:
- To demonstrate geometric and full contrast dynamical simulation of on-axis TKD patterns.
- To develop a diffraction geometry calibration routine for accurate simulation.
- To improve the understanding of the physical processes in TKD pattern formation.
Main Methods:
- Experimental TKD patterns were captured using a direct electron detector in a scanning electron microscope.
- A diffraction geometry calibration routine was developed based on the electron channelling pattern of the detector.
- Geometric and dynamical simulations were performed, incorporating weight factors, diffuse intensity simulation, and energy spectra calculation.
Main Results:
- Accurate accounting for diffraction spot positions in both geometric and dynamical simulations was achieved, showing good agreement with experimental patterns.
- Simulated TKD patterns successfully captured various diffraction features present in experimental patterns.
- A robust method for simulating on-axis TKD patterns with enhanced accuracy was demonstrated.
Conclusions:
- The developed simulation workflows and findings can significantly improve TKD pattern indexing routines.
- This work enhances the fundamental understanding of the physical processes governing on-axis TKD pattern formation.
- The findings contribute to more accurate and reliable materials characterization using electron microscopy techniques.
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