Atomic Force Microscopy
Raman Spectroscopy Instrumentation: Overview
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Updated: Dec 26, 2025

Rejection of Fluorescence Background in Resonance and Spontaneous Raman Microspectroscopy
Published on: May 18, 2011
Giovanni Luca Bartolomeo1, Guillaume Goubert1, Renato Zenobi1
1Department of Chemistry and Applied Biosciences, Swiss Federal Institute of Technology (ETH) Zurich, Zurich, Switzerland.
This study introduces a cleaning method to reuse silver-coated atomic force microscopy-tip-enhanced Raman spectroscopy (AFM-TERS) probes. This approach significantly cuts costs and reduces waste associated with TERS experiments.
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