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Bidirectional Reflectometry. Part I.: A High Resolution Laser Bidirectional Reflectometer With Results on Several

Jack J Hsia¹, Joseph C Richmond¹

¹Institute for Basic Standards, National Bureau of Standards, Washington, D.C. 20234.

Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry

|March 21, 2020

Summary

A new automated bidirectional reflectometer with one-degree angular resolution was developed. This instrument precisely measures light reflection from surfaces across a wide range of angles for various coatings.

Keywords:

Barium sulphate bidirectional reflectance bidirectional reflectometer black coating gonioreflectometer magnesium oxide mu sulphur reflectance reflectometer sodium chloride

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Area of Science:

Optical engineering
Materials science

Background:

Understanding surface reflectance is crucial for applications in optics and materials science.
Existing reflectometry methods may lack automation or precise angular control.

Purpose of the Study:

To design and construct a fully automated bidirectional reflectometer.
To achieve high angular resolution for detailed surface reflectance analysis.

Main Methods:

Development of a laser-source bidirectional reflectometer with independent control of incidence and viewing angles.
Hemispherical angular variation capability (excluding angles > 77.5° from normal) with a minimum 2.5° separation between directions.
Automated data acquisition and analysis.

Main Results:

The designed instrument achieves an angular resolution of approximately one degree.
Bidirectional reflectance data were successfully collected for 15 distinct black and white coating samples.
The system demonstrated reliable performance across a broad hemispherical range.

Conclusions:

The automated bidirectional reflectometer is a functional and precise tool for surface reflectance characterization.
The collected data provide valuable insights into the optical properties of various coatings.
This instrument facilitates advanced research in optical materials and surface analysis.