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In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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Active Transiency: A Novel Approach to Expedite Degradation in Transient Electronics

Reihaneh Jamshidi1, Yuanfen Chen2, Reza Montazami3

  • 1Department of Mechanical Engineering, University of Hartford, West Hartford, CT 06117, USA.

Materials (Basel, Switzerland)
|April 1, 2020
PubMed

Keywords:
active transiencypolymer compositestransient electronics

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