Bilayer synchronous measuring method of curved screen based on a line-structured light-scanning sensor

Area of Science:

• Optical Engineering
• Metrology
• Materials Science

Background:

• Curved screens are integral to modern technology, including wearables, optics, and aerospace.
• Evaluating the overall quality of large-area curved screens presents significant challenges.
• Existing methods struggle with the complexity of multilayered curved structures.

Purpose of the Study:

• To develop a novel, efficient method for the quality evaluation of large-area bilayer curved screens.
• To enable synchronous measurement of integrated shape information using a single probe.
• To address challenges associated with weak reflections and positional deviations in curved surfaces.

Main Methods:

• Line-structured light scanning for bilayer synchronous measurement.
• Two-step image processing in image and 3D data space to reduce noise from weak reflections.
• An optimization-based splicing algorithm to correct positional deviations for large-area measurements.

Main Results:

• The proposed method successfully obtained integrated shape information of a large bilayer curved screen in a single scanning step.
• Experimental validation confirmed the method's effectiveness for curved mobile phone screens.
• The technique demonstrated potential for measuring other multilayered components, such as camera lenses.

Conclusions:

• The novel line-structured light scanning method provides an effective solution for measuring large-area bilayer curved screens.
• The integrated approach simplifies data acquisition and improves accuracy by reducing noise and correcting deviations.
• This technique holds promise for quality control and metrology in advanced display technologies and multilayered optical components.