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Ultra-narrow-linewidth measurement utilizing dual-parameter acquisition through a partially coherent light
Optics Express
|April 1, 2020
Summary
Measuring ultra-narrow laser linewidths is now simpler. This new method uses partially coherent light interference and dual-parameter acquisition, achieving high accuracy by minimizing noise with long-delay fibers.
Area of Science:
- Optics and Photonics
- Metrology
Background:
- Measuring ultra-narrow laser linewidths (around 100 Hz) presents significant technological challenges.
- Existing methods often struggle with accuracy and susceptibility to noise.
Purpose of the Study:
- To develop a simple and efficient method for measuring ultra-narrow laser linewidths.
- To overcome the limitations of current linewidth measurement technologies.
Main Methods:
- Utilized dual-parameter acquisition based on partially coherent light interference.
- Employed a kilometer-order-length delay fiber to mitigate 1/f noise.
- Extracted linewidth information from two easily obtainable parameters in the power spectrum.
Main Results:
- The proposed method demonstrated independence from fiber-length errors in general scenarios.
- Simulations indicated a total linewidth measurement error below 0.3% for fiber length errors under 10%.
- Experimental validation confirmed the method's feasibility and high performance.
Conclusions:
- The novel dual-parameter acquisition method offers a robust solution for ultra-narrow linewidth measurement.
- This technique provides superior performance and accuracy compared to existing technologies.
- It simplifies the measurement process for critical applications in laser science and engineering.
