High efficiency and stability of ink-jet printed quantum dot light emitting diodes
Chaoyu Xiang1,2, Longjia Wu3, Zizhe Lu3
1TCL Research, No. 1001 Zhongshan Park Road, Nanshan District, Shenzhen, 518067, People's Republic of China. xiangchaoyu@nimte.ac.cn.
Abstract:
The low efficiency and fast degradation of devices from ink-jet printing process hinders the application of quantum dot light emitting diodes on next generation displays. Passivating the trap states caused by both anion and cation under-coordinated sites on the quantum dot surface with proper ligands for ink-jet printing processing reminds a problem. Here we show, by adapting the idea of dual ionic passivation of quantum dots, ink-jet printed quantum dot light emitting diodes with an external quantum efficiency over 16% and half lifetime of more than 1,721,000 hours were reported for the first time. The liquid phase exchange of ligands fulfills the requirements of ink-jet printing processing for possible mass production. And the performance from ink-jet printed quantum dot light emitting diodes truly opens the gate of quantum dot light emitting diode application for industry.


