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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
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In Situ Detection and Single Cell Quantification of Metal Oxide Nanoparticles Using Nuclear Microprobe Analysis

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Nanoscale Atomic Density Microscopy.

S Subhankar¹, Y Wang¹, T-C Tsui¹

¹Joint Quantum Institute, National Institute of Standards and Technology and the University of Maryland, College Park, Maryland 20742 USA.

Physical Review. X

|April 10, 2020

Summary

This summary is machine-generated.

Researchers developed a super-resolution quantum microscope using ultracold atoms. This technique overcomes the diffraction limit for imaging atomic wavefunctions with unprecedented detail and speed.

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Area of Science:

Quantum physics
Atomic physics
Microscopy

Background:

Direct imaging of ultracold atoms is limited by optical diffraction.
Existing methods struggle to resolve atomic wavefunctions at optical length scales.

Purpose of the Study:

To overcome the diffraction limit in imaging ultracold atoms.
To develop a super-resolution imaging technique for quantum simulations.

Main Methods:

Utilized a non-linear atomic response and quantum interference.
Developed a quantum microscope surpassing the diffraction limit.
Achieved imaging with a resolution of λ/50 and temporal resolution of 500 ns.

Main Results:

Demonstrated super-resolution imaging of atomic wavefunctions.
Characterized microscope performance by measuring atomic probability density in optical lattices.
Observed dynamics of excited atoms with high temporal resolution.

Conclusions:

The developed quantum microscope offers a powerful new tool for studying quantum systems.
This technique can be applied to various atomic and molecular systems with three-level structures.
Enables detailed investigation of quantum phenomena previously inaccessible due to resolution limits.