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Updated: Dec 23, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Xuanmiao Hong1, Guangwei Hu2,3, Wenchao Zhao1
1Wuhan National Laboratory for Optoelectronics and School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China.
Researchers developed a hybrid nonlinear interface combining transition-metal dichalcogenide (TMDC) monolayers and plasmonic nanosieves. This novel structure enables advanced nonlinear optical functionalities like OAM generation and holographic imaging with enhanced performance.
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