Instantaneous tension measurements in droplet interface bilayers using an inexpensive, integrated pendant drop camera

Recently, droplet interface bilayers (DIBs) have been used to determine bilayer tension and thickness in situ by automated image analysis using a microscope and an applied voltage. In this paper, we demonstrate improvements to these measurements by integrating an inexpensive pendant drop setup onto the microscope stage, which allows for simultaneous imaging of DIBs from both the bottom and side. By using pendant drop shape analysis in situ to determine the monolayer tension of the droplets, we avoid the reliance on applied voltages to determine tension. The integrated system also allows for direct measurement of both the major and minor diameter of the elliptical contact region, which produces a more direct measurement of the bilayer specific capacitance. Additionally, we demonstrate a technique for measuring the instantaneous monolayer tension of DIBs using shape analysis despite the assumed requirement for axial symmetry in pendant drop tensiometry. Compared to previous DIB measurements, the integrated pendant drop-microscope system provides improved accuracy accompanied by a fivefold to twentyfold improvement in precision while considerably decreasing the experiment time.