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Inter- and Intragrain Inhomogeneity in 2D Perovskite Thin Films Revealed by Relative Grain Orientation Imaging Using
Shogo Toda1, Naoya Yanagita1, Efat Jokar2,3
1Department of Chemistry, Graduate School of Science and Technology, Kwansei Gakuin University, Hyogo 669-1337, Japan.
The Journal of Physical Chemistry Letters
|April 28, 2020
Summary
Ultra-low-frequency polarized Raman microspectroscopy visualizes grain orientations in 2D perovskite films. This technique offers insights into grain structure and inhomogeneity, crucial for optoelectronic device performance.
Area of Science:
- Materials Science
- Solid-State Physics
- Optoelectronics
Background:
- Two-dimensional (2D) organic-inorganic hybrid lead halide perovskites are promising semiconductor materials for optoelectronics.
- Grain structure significantly impacts the functionality of 2D perovskite devices.
- Existing in situ characterization methods for 2D perovskite grains are limited.
Purpose of the Study:
- To introduce ultra-low-frequency polarized Raman microspectroscopy as a facile method for characterizing 2D perovskite grains.
- To demonstrate the visualization of relative grain orientations within 2D perovskite thin films.
- To explore intragrain inhomogeneity in these materials.
Main Methods:
- Utilizing ultra-low-frequency polarized Raman microspectroscopy.
- Applying hierarchical clustering to Raman imaging data.
- Performing detailed band decomposition analysis.
Main Results:
- Successfully visualized relative grain orientations in (CH3(CH2)3NH3)2PbI4, a simple 2D perovskite.
- Identified intragrain inhomogeneity using Raman imaging data analysis.
- Demonstrated the facile and powerful nature of the technique.
Conclusions:
- Ultra-low-frequency polarized Raman microspectroscopy is an effective tool for analyzing 2D perovskite grain structures.
- The method provides chemical specificity for characterizing perovskite materials.
- This technique has broad applicability for 2D perovskites and related optoelectronic devices.
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