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Published on: September 28, 2016
High-efficiency ultra-precision comparator for d-spacing mapping measurement of silicon
Junliang Yang1, Tang Li1, Ye Zhu1
1Institute of High Energy Physics, Chinese Academy of Science, Yuquan Road 19B, Shijingshan District, Beijing 100049, People's Republic of China.
Abstract:
This article describes a high-efficiency experimental configuration for a self-referenced lattice comparator with a `brush beam' of synchrotron radiation from a bending magnet and two linear position-sensitive photon-counting-type X-ray detectors. The efficiency is more than ten times greater compared with the `pencil-beam' configuration and a pair of zero-dimensional detectors. A solution for correcting the systematic deviation of d-spacing measurements caused by the horizontal non-uniformity of the brush beam is provided. Also, the use of photon-counting-type one-dimensional detectors not only improves the spatial resolution of the measurements remarkably but can also adjust the sample's attitude angles easily.

