Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

High-precision tilt stage for the high-voltage electron microscope.

J N Turner1, D P Barnard, G Matuszek

  • 1Wadsworth Center for Laboratories and Research, New York State Department of Health, Albany 12201-0509.

Ultramicroscopy
|January 1, 1988
PubMed
Summary

A new single-tilt stage enhances high-voltage electron microscopy for 3D ultrastructural imaging. This precision stage enables accurate specimen orientation, crucial for detailed three-dimensional reconstructions of thick samples.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Modelling spatial and temporal variations of annual suspended sediment yields from small agricultural catchments.

The Science of the total environment·2017
Same author

Measurement differences between turbidity instruments, and their implications for suspended sediment concentration and load calculations: A sensor inter-comparison study.

Journal of environmental management·2017
Same author

Evaluating the relationship between biotic and sediment metrics using mesocosms and field studies.

The Science of the total environment·2016
Same author

The impact of cattle access on ecological water quality in streams: Examples from agricultural catchments within Ireland.

The Science of the total environment·2016
Same author

Scanning optical microellipsometer for pure surface profiling.

Applied optics·2010
Same author

Blind deconvolution of fluorescence micrographs by maximum-likelihood estimation.

Applied optics·2010

Area of Science:

  • Materials Science
  • Microscopy
  • Biophysics

Background:

  • High-voltage electron microscopy (HVEM) is vital for studying thick biological and material samples.
  • Three-dimensional (3D) image reconstruction requires precise control over specimen orientation during imaging.
  • Existing stages may lack the necessary precision or stability for advanced tomographic methods.

Purpose of the Study:

  • To design and operate a precision single-tilt stage for HVEM.
  • To enable accurate specimen orientation for 3D image reconstructions.
  • To improve ultrastructural resolution in thick samples.

Main Methods:

  • Developed a single-tilt stage with +/- 0.06 degrees precision.
  • Integrated two translations, height adjustment, and tilting into a single objective lens port.

Related Experiment Videos

  • Utilized rubber gaskets for vibration isolation and motorized micrometers with encoders for motion control.

    • Main Results:

    • The stage achieves high precision for specimen-beam orientation.
    • Motions are precisely controlled and monitored.
    • The stage exhibits stability of 0.6 nm for at least 16 seconds.
    • Capable of tilt angles up to +/- 70 degrees.

    Conclusions:

    • The developed stage supports advanced 3D imaging in HVEM.
    • It facilitates accurate tomographic reconstructions of thick samples.
    • Enhances the capability for ultrastructural analysis at high resolution.