Bipolar Junction Transistor
Schottky Barrier Diode
P-N junction
Semiconductors
Biasing of P-N Junction
Biasing of Metal-Semiconductor Junctions
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Updated: Dec 21, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Researchers developed a novel lateral bipolar junction transistor (BJT) on a silicon photonics platform, achieving a high transimpedance for improved electronic-photonic integration. This advancement enhances signal processing efficiency in integrated photonic systems.
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