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Updated: Dec 21, 2025

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Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
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Corrigendum to "Spherical aberration correction in a scanning transmission electron microscope using a sculpted thin
Roy Shiloh1, Roei Remez1, Peng-Han Lu2
1School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel.
Ultramicroscopy
|May 17, 2020
Abstract
No abstract available in PubMed .
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