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Related Experiment Video

Updated: Dec 21, 2025

Author Spotlight: Advancing Knowledge in Far-From-Equilibrium Materials Through Light-Sheet Microscopy
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Light-Sheet Microscopy for Surface Topography Measurements and Quantitative Analysis.

Zhanpeng Xu1, Erik Forsberg1, Yang Guo1

  • 1Centre for Optical and Electromagnetic Research, National Engineering Research Center for Optical Instruments, Zhejiang Provincial Key Laboratory for Sensing Technologies, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310058, China.

Sensors (Basel, Switzerland)
|May 21, 2020
PubMed
Summary
This summary is machine-generated.

A new light-sheet microscopy system quantitatively analyzes opaque sample topography using laser triangulation. This innovative method offers high resolution and a large field-of-view for diverse applications.

Keywords:
3D reconstructionlaser triangulationlight-sheet microscopy (LSM)line scanningquantitative analysissurface topography

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Area of Science:

  • Optics and Photonics
  • Microscopy Techniques
  • Surface Metrology

Background:

  • Quantitative surface topography analysis is crucial for material science and industrial inspection.
  • Traditional methods may struggle with opaque or complex sample geometries.
  • Advancements in microscopy are needed for high-resolution, non-contact surface characterization.

Purpose of the Study:

  • To introduce a novel light-sheet microscopy (LSM) system for quantitative surface topography analysis.
  • To demonstrate the system's capability in analyzing opaque samples using laser triangulation.
  • To highlight the system's potential for both industrial and scientific applications.

Main Methods:

  • Development of a light-sheet microscopy system incorporating laser triangulation.
  • Quantitative calculation and analysis of surface topography.
  • System calibration using a linear formula for ease of use.

Main Results:

  • Achieved spatial resolution of 10 μm (z), 10 μm (x), and 25 μm (y) with a large field-of-view.
  • Verified system functionality through various sample measurements.
  • Demonstrated a simple mechanical structure allowing for resolution improvement via objective replacement.

Conclusions:

  • The novel LSM system provides accurate and efficient surface topography analysis for opaque samples.
  • The system's design facilitates easy calibration and potential resolution enhancement.
  • Potential applications include industrial line inspections and 3D analysis of translucent/layered structures.