Peak Force Infrared-Kelvin Probe Force Microscopy

Area of Science:

• Materials Science
• Nanotechnology
• Surface Science
• Spectroscopy

Background:

• Correlative scanning probe microscopy (SPM) is crucial for understanding nanomaterial structure-function relationships.
• Simultaneously measuring chemical identity, surface potential, and mechanical properties at high resolution remains a significant challenge.
• Existing techniques often require multiple passes or compromise resolution for multimodal analysis.

Purpose of the Study:

• To develop a novel SPM technique enabling simultaneous, high-resolution, multimodal characterization of nanomaterials.
• To investigate the in situ degradation pathways of MAPbBr3 perovskite crystals.
• To explore the relationship between charge distribution and structural conformation in amyloid fibrils.

Main Methods:

• Integration of nanoscale photothermal infrared imaging with Coulomb force detection.
• Development of peak force infrared-Kelvin probe force microscopy (PFIR-KPFM).
• Single-pass scanning for simultaneous nanomapping of infrared absorption, surface potential, and mechanical properties at ~10 nm resolution.

Main Results:

• PFIR-KPFM successfully mapped chemical, electrical, and mechanical properties simultaneously with high spatial resolution.
• Observed nanoscale charge accumulations in MAPbBr3 perovskite crystals near the PbBr2 boundary during in situ degradation.
• Revealed correlations between residual charges and secondary conformations in amyloid fibrils.

Conclusions:

• PFIR-KPFM offers a powerful new tool for correlative multimodal characterization at the nanoscale.
• The technique provides unprecedented insight into the degradation mechanisms of perovskite materials.
• PFIR-KPFM is broadly applicable to heterogeneous materials, facilitating advanced nanoscale research.