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Related Concept Videos

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Updated: Dec 20, 2025

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
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Peak Force Infrared-Kelvin Probe Force Microscopy.

Devon S Jakob1, Haomin Wang1, Guanghong Zeng2

  • 1Department of Chemistry, Lehigh University, 6 E Packer Ave., Bethlehem, PA, 18015, USA.

Angewandte Chemie (International Ed. in English)
|May 29, 2020
PubMed
Summary
This summary is machine-generated.

We developed peak force infrared-Kelvin probe force microscopy (PFIR-KPFM) for simultaneous nanoscale mapping of chemical, electrical, and mechanical properties. This technique reveals charge accumulations in perovskites and correlations in amyloid fibrils.

Keywords:
IR spectroscopyamyloid fibrilsperovskitesscanning probe microscopysurface potential

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science
  • Spectroscopy

Background:

  • Correlative scanning probe microscopy (SPM) is crucial for understanding nanomaterial structure-function relationships.
  • Simultaneously measuring chemical identity, surface potential, and mechanical properties at high resolution remains a significant challenge.
  • Existing techniques often require multiple passes or compromise resolution for multimodal analysis.

Purpose of the Study:

  • To develop a novel SPM technique enabling simultaneous, high-resolution, multimodal characterization of nanomaterials.
  • To investigate the in situ degradation pathways of MAPbBr3 perovskite crystals.
  • To explore the relationship between charge distribution and structural conformation in amyloid fibrils.

Main Methods:

  • Integration of nanoscale photothermal infrared imaging with Coulomb force detection.
  • Development of peak force infrared-Kelvin probe force microscopy (PFIR-KPFM).
  • Single-pass scanning for simultaneous nanomapping of infrared absorption, surface potential, and mechanical properties at ~10 nm resolution.

Main Results:

  • PFIR-KPFM successfully mapped chemical, electrical, and mechanical properties simultaneously with high spatial resolution.
  • Observed nanoscale charge accumulations in MAPbBr3 perovskite crystals near the PbBr2 boundary during in situ degradation.
  • Revealed correlations between residual charges and secondary conformations in amyloid fibrils.

Conclusions:

  • PFIR-KPFM offers a powerful new tool for correlative multimodal characterization at the nanoscale.
  • The technique provides unprecedented insight into the degradation mechanisms of perovskite materials.
  • PFIR-KPFM is broadly applicable to heterogeneous materials, facilitating advanced nanoscale research.