Atomic Force Microscopy
Overview of Microscopy Techniques
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Devon S Jakob1, Haomin Wang1, Guanghong Zeng2
1Department of Chemistry, Lehigh University, 6 E Packer Ave., Bethlehem, PA, 18015, USA.
We developed peak force infrared-Kelvin probe force microscopy (PFIR-KPFM) for simultaneous nanoscale mapping of chemical, electrical, and mechanical properties. This technique reveals charge accumulations in perovskites and correlations in amyloid fibrils.
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