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German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with...
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Contemporary x-ray wavelength metrology and traceability.

L T Hudson1, J P Cline1, A Henins1

  • 1National Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, MD, 20899, USA.

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Recent advances in x-ray wavelength metrology enable traceable standards using advanced diffraction spectrometers and interferometry. New methods improve accuracy and quantify uncertainties for critical scientific and industrial data.

Keywords:
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Area of Science:

  • X-ray physics and metrology
  • Materials science
  • Data science

Background:

  • Primary x-ray wavelength standards are crucial for scientific accuracy.
  • Current methods rely on diffraction spectrometers with limitations in traceability and uncertainty quantification.
  • Need for updated standard reference data in x-ray science.

Purpose of the Study:

  • To report advances in absolute x-ray wavelength metrology.
  • To enhance the traceability of primary x-ray wavelength standards to the international meter definition.
  • To support the production of modern standard reference data for science and industry.

Main Methods:

  • Utilizing diffraction spectrometers in dispersive and non-dispersive geometries.
  • Employing x-ray-optical interferometry for absolute lattice-spacing provenance.
  • Implementing advanced goniometry, electronic x-ray area detectors, and in situ alignment techniques.

Main Results:

  • Achieved enhanced traceability of measurement results to the Système internationale definition of the meter.
  • Enabled robust quantification of previously elusive systematic uncertainties.
  • Developed capabilities supporting NIST Standard Reference Data programs and international collaborations.

Conclusions:

  • Modern metrology advances offer new opportunities for x-ray reference data tabulation.
  • Complementary spectroscopic techniques aid in identifying weak x-ray lines for material analysis.
  • Improved standard reference data will benefit diverse scientific and industrial applications.