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Updated: Mar 11, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
High resolution spectrometer for extended x-ray absorption fine structure measurements in the 6 keV to 15 keV energy
J F Seely1, L T Hudson2, Albert Henins2
1Artep Inc., 2922 Excelsior Springs Court, Ellicott City, Maryland 21042, USA.
Abstract:
A Cauchois transmission-crystal spectrometer has been developed with high crystal resolving power in the 6 keV-15 keV energy range and sufficient sensitivity to record single-shot spectra from the Lawrence Livermore National Laboratory (LLNL) Titan laser and other comparable or more energetic lasers. The spectrometer capabilities were tested by recording the W L transitions from a laboratory source and the extended x-ray absorption fine structure (EXAFS) spectrum through a Cu foil.
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