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Updated: Jul 1, 2025

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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The NIST Vacuum Double-Crystal Spectrometer: A Tool for SI-Traceable Measurement of X-Ray Emission Spectra

Csilla I Szabo1,2, James P Cline1, Albert Henins1

  • 1National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.

Journal of Research of the National Institute of Standards and Technology
|March 12, 2024
PubMed

Keywords:
double-crystal spectrometerwavelength standardsx-ray spectroscopyx-ray transition energies

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