Contemporary x-ray wavelength metrology and traceability

Area of Science:

• X-ray physics and metrology
• Materials science
• Data science

Background:

• Primary x-ray wavelength standards are crucial for scientific accuracy.
• Current methods rely on diffraction spectrometers with limitations in traceability and uncertainty quantification.
• Need for updated standard reference data in x-ray science.

Purpose of the Study:

• To report advances in absolute x-ray wavelength metrology.
• To enhance the traceability of primary x-ray wavelength standards to the international meter definition.
• To support the production of modern standard reference data for science and industry.

Main Methods:

• Utilizing diffraction spectrometers in dispersive and non-dispersive geometries.
• Employing x-ray-optical interferometry for absolute lattice-spacing provenance.
• Implementing advanced goniometry, electronic x-ray area detectors, and in situ alignment techniques.

Main Results:

• Achieved enhanced traceability of measurement results to the Système internationale definition of the meter.
• Enabled robust quantification of previously elusive systematic uncertainties.
• Developed capabilities supporting NIST Standard Reference Data programs and international collaborations.

Conclusions:

• Modern metrology advances offer new opportunities for x-ray reference data tabulation.
• Complementary spectroscopic techniques aid in identifying weak x-ray lines for material analysis.
• Improved standard reference data will benefit diverse scientific and industrial applications.