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Updated: Dec 19, 2025

Measurement and Analysis of Atomic Hydrogen and Diatomic Molecular AlO, C2, CN, and TiO Spectra Following Laser-induced Optical Breakdown
Published on: February 14, 2014
Error evaluation of Judd-Ofelt spectroscopic analysis.
Yun Zhang1, Jia-Min Liu1, Mei-Hong Liu1
1Department of Opto-electronics and Information Engineering, School of Precision Instruments and Opto-electronics Engineering, Key Laboratory of Optoelectronic Information Science & Technology (Ministry of Education), Tianjin University, Tianjin 300072, China.
This study establishes a theory for evaluating errors in Judd-Ofelt (J-O) parameters and radiative probabilities for rare-earth-doped materials. The findings offer a reliable method for assessing the accuracy of J-O analysis in luminescent materials.
Area of Science:
- Materials Science
- Spectroscopy
- Quantum Mechanics
Background:
- Judd-Ofelt (J-O) analysis is vital for understanding rare-earth-doped luminescent materials.
- Previous studies often omit error analysis for J-O intensity parameters (Ωᵢ) and radiative probabilities.
- Accurate error quantification is essential for reliable material characterization and application.
Discussion:
- This work introduces a novel error theory for J-O spectroscopic analysis.
- Two distinct methods, root mean square of difference in oscillator strengths (δfrms) and line strengths (δSrms), are explored for error evaluation.
- Explicit error expressions are derived for J-O parameters and radiative probabilities.
Key Insights:
- The developed theory provides a robust framework for error assessment in J-O spectroscopic studies.
- The two error analysis methods yield comparable results, validating their consistency.
- The theory is successfully applied to various rare-earth ions (Er³⁺, Tm³⁺, Ho³⁺, Nd³⁺) in diverse host matrices.
Outlook:
- This research paves the way for more rigorous and reliable J-O analyses in the field of luminescent materials.
- It enables precise evaluation of material performance for applications in lasers, lighting, and optical devices.
- Future work can extend this error analysis to other spectroscopic models and material systems.
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