Quantitative mapping of high modulus materials at the nanoscale: comparative study between atomic force microscopy...

Area of Science:

• Materials Science
• Nanotechnology
• Surface Science

Background:

• Understanding local mechanical properties at the submicron scale is crucial for predicting macroscopic material behavior.
• Atomic Force Microscopy (AFM) offers advanced modes for high-resolution nanomechanical characterization.

Purpose of the Study:

• To evaluate a novel AFM mode for local nanomechanical measurements with high spatial resolution.
• To compare the accuracy of this advanced AFM mode with classical instrumented nanoindentation.
• To assess the influence of AFM probe characteristics on measurement outcomes.

Main Methods:

• Utilized a state-of-the-art AFM mode with precise peak force control at each pixel.
• Employed two hand-crafted natural diamond tips with steel cantilevers for mapping.
• Performed real-time force curve analysis in the elastic region for contact moduli determination.
• Compared AFM-derived moduli of silica beads in epoxy resin with results from nanoindentation tests.

Main Results:

• The advanced AFM mode accurately measured high moduli of silica beads (>50 GPa) in an epoxy matrix.
• AFM measurements showed good agreement with classical nanoindentation, falling within the standard deviation.
• No local residual deformation was observed, preserving surface integrity.

Conclusions:

• The advanced AFM mode provides reliable local nanomechanical property mapping with high spatial resolution.
• Probe characteristics significantly impact measurement accuracy in this advanced AFM mode.
• This technique offers a non-destructive method for characterizing nanoscale mechanical properties.