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Updated: Dec 18, 2025

Phase Contrast and Differential Interference Contrast DIC Microscopy
Published on: August 6, 2008
Seho Lee1, Ohsung Oh1, Youngju Kim1
1School of Mechanical Engineering, Pusan National University, Busan, 46241, Republic of Korea.
A new deep learning method overcomes the trade-off between phase sensitivity and spatial resolution in Talbot-Lau interferometry. This approach enhances imaging quality for both neutron and X-ray sources, improving phase sensitivity and resolution in experimental data.
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