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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Dec 17, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

Near-zero contact force atomic force microscopy investigations using active electromagnetic cantilevers.

B Świadkowski¹, W Majstrzyk¹, P Kunicki¹

¹Department of Nanometrology, Wroclaw University of Science and Technology, Wrocław 50-372, Poland.

|June 30, 2020

Summary

This summary is machine-generated.

This study introduces active electromagnetic cantilevers for Atomic Force Microscopy (AFM), enhancing surface imaging. A novel PredPID control algorithm precisely manages cantilever deflection for improved measurements.

Keywords:

AFM active cantilever adhesion force electromagnetic cantilever zero force

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Area of Science:

Surface Science
Nanotechnology
Microscopy

Background:

Atomic Force Microscopy (AFM) is a high-resolution surface imaging technique.
Contact AFM (C AFM) mode involves continuous tip-sample contact.
Active cantilever technology offers enhanced control and precision.

Purpose of the Study:

To implement active electromagnetic cantilevers in AFM for improved surface characterization.
To explore the capabilities of electromagnetic actuation for cantilever control.
To develop and apply a novel control algorithm for precise force management.

Main Methods:

Utilized active electromagnetic cantilevers with integrated conductive loops.
Applied an electric current in a magnetic field to generate Lorentz force for cantilever deflection.
Developed and implemented the PredPID control algorithm for precise load force maintenance.
Calibrated probe stiffness with reduced uncertainty.

Main Results:

Demonstrated precise excitation and control of cantilever deflection using electromagnetic actuation.
Achieved accurate estimation of Lorentz force for cantilever manipulation.
Successfully applied the PredPID algorithm to maintain constant load force.
Showcased improved probe stiffness calibration compared to standard methods.

Conclusions:

Active electromagnetic cantilevers represent significant progress in AFM technology.
The PredPID algorithm enables advanced control for high-sensitivity surface measurements.
This approach offers enhanced precision and reduced uncertainty in AFM applications.