Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

4.3K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
4.3K
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

5.6K
To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
5.6K
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

9.3K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
9.3K
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

10.6K
The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
10.6K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Near-zero contact force atomic force microscopy investigations using active electromagnetic cantilevers.

Nanotechnology·2020
Same author

Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode.

Ultramicroscopy·2017
Same author

Metrology of electromagnetic static actuation of MEMS microbridge using atomic force microscopy.

Micron (Oxford, England : 1993)·2016
Same author

Investigation of multi-junction solar cells using electrostatic force microscopy methods.

Ultramicroscopy·2014
Same author

Regularization mechanism in blind tip reconstruction procedure.

Ultramicroscopy·2012
Same author

Expanded beam deflection method for simultaneous measurement of displacement and vibrations of multiple microcantilevers.

The Review of scientific instruments·2011

Related Experiment Video

Updated: Aug 11, 2025

Miniaturized Sample Preparation for Transmission Electron Microscopy
09:04

Miniaturized Sample Preparation for Transmission Electron Microscopy

Published on: July 27, 2018

19.9K

Ion microsource integrated with scanning electron microscope for sample preparation.

W Slówko1, T Gotszalk1

  • 1Wrocław University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Nanometrology Department, ul. Z. Janiszewskiego 11/17, PL50-372 Wrocław, Poland.

Micron (Oxford, England : 1993)
|February 2, 2023
PubMed
Summary
This summary is machine-generated.

Researchers developed a compact Argon ion (Ar+) microsource for Scanning Electron Microscopes (SEM). This tool enables precise microvolume removal and 3D imaging of internal specimen structures by combining ion beam technology with multidetector imaging.

Keywords:
Ar(+) ion microsourceFilamentary ion beamIon beam etchingScanning electron microscope (SEM)Three-dimensional imaging

More Related Videos

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes
13:49

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes

Published on: January 19, 2020

6.8K
Biological Sample Preparation by High-pressure Freezing, Microwave-assisted Contrast Enhancement, and Minimal Resin Embedding for Volume Imaging
07:33

Biological Sample Preparation by High-pressure Freezing, Microwave-assisted Contrast Enhancement, and Minimal Resin Embedding for Volume Imaging

Published on: March 19, 2019

10.7K

Related Experiment Videos

Last Updated: Aug 11, 2025

Miniaturized Sample Preparation for Transmission Electron Microscopy
09:04

Miniaturized Sample Preparation for Transmission Electron Microscopy

Published on: July 27, 2018

19.9K
Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes
13:49

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes

Published on: January 19, 2020

6.8K
Biological Sample Preparation by High-pressure Freezing, Microwave-assisted Contrast Enhancement, and Minimal Resin Embedding for Volume Imaging
07:33

Biological Sample Preparation by High-pressure Freezing, Microwave-assisted Contrast Enhancement, and Minimal Resin Embedding for Volume Imaging

Published on: March 19, 2019

10.7K

Area of Science:

  • Materials Science
  • Physics
  • Analytical Chemistry

Background:

  • Standard Scanning Electron Microscopes (SEM) offer surface imaging but limited internal structural analysis.
  • Precise micro-milling and 3D reconstruction of materials are crucial for advanced research and technology.

Purpose of the Study:

  • To develop and characterize a compact Argon ion (Ar+) microsource for integration into standard SEMs.
  • To enable in-situ micro-milling and subsequent 3D imaging of internal specimen structures.

Main Methods:

  • Design and fabrication of a ceramic discharge capillary ion microsource with specific anode and cathode configurations.
  • Testing of different cathode designs and extraction voltage supply schemes.
  • Integration of the microsource into a standard SEM, coupled with a four-quadrant backscattered electron (BSE) detector for multidetector 3D imaging.

Main Results:

  • The Ar+ ion microsource generates a filamentary ion beam (few tens of µm diameter) with up to 50 µA current at -4 kV extraction voltage.
  • The microsource is compact, fits standard SEMs without modification, and avoids interference with standard SEM operations.
  • The system successfully enabled 3D imaging of internal structures by combining ion milling with multidetector BSE and secondary electron (SE) imaging.

Conclusions:

  • The developed Ar+ ion microsource is a versatile tool for both technological applications (micro-aperture creation) and advanced scientific research.
  • It provides a novel capability for non-destructive 3D internal structural analysis within a standard SEM environment.
  • The combination of ion milling and multidetector imaging significantly enhances the interpretation of material and topographical information.