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Concurrent Quantitative Conductivity and Mechanical Properties Measurements of Organic Photovoltaic Materials using AFM

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Investigation of multi-junction solar cells using electrostatic force microscopy methods.

M Moczała¹, N Sosa², A Topol²

¹Wrocław University of Technology, Faculty of Microsystem Electronics and Photonics, Division of Metrology of Micro- and Nanostructures, ul. Z. Janiszewskiego 11/17, 50-372 Wrocław, Poland.

Ultramicroscopy

|April 1, 2014

Summary

This summary is machine-generated.

Researchers used Kelvin probe force microscopy to measure the built-in potential of multi-junction III-V solar cells. This technique provides insights for improving photovoltaic device design, especially under current mismatched conditions.

Keywords:

Epitaxial structures High-efficiency solar cells III–V Semiconductors In-situ illumination Kelvin probe force microscopy Multi-junction solar cells

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Area of Science:

Materials Science
Electrical Engineering
Renewable Energy

Background:

Multi-junction III-V solar cells offer high conversion efficiencies by broadening solar spectrum absorption.
Efficiency can be further enhanced through solar concentration, making them ideal for optimization studies.

Purpose of the Study:

To report on electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM) measurements of built-in potential in multi-junction III-V solar cells.
To present a novel method for measuring individual p-n junction electrical characteristics within a working solar cell.
To demonstrate how these measurements can provide feedback for improved photovoltaic device design.

Main Methods:

Utilized Kelvin probe force microscopy (KPFM) to qualitatively assess individual p-n junction properties (width, built-in potential, activity, thickness).
Measured voltage drops across individual solar cell p-n junctions under various operating conditions (dark, illuminated, short-circuit, biased).
Employed a method focusing on individual junction electrical characteristics by selecting specific spectral ranges of illumination.

Main Results:

Successfully measured the built-in potential and electrical properties of individual junctions in multi-junction III-V solar cells.
Demonstrated the ability to analyze voltage drops across junctions under different operational states.
Showcased a method for targeted analysis of junction behavior using selective spectral illumination.

Conclusions:

The developed analysis technique offers valuable insights into multi-junction solar cell behavior.
Pragmatic studies using this method can guide improvements in photovoltaic device design, particularly for current mismatched scenarios.
This approach shows promise for advancing the field of high-efficiency solar energy conversion.