Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

4.2K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
4.2K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Precision surface metrology using a rapid optimization method in diffraction phase microscopy.

Applied optics·2026
Same author

Deep learning approach for flow visualization in background-oriented schlieren.

Applied optics·2025
Same author

Raman spectroscopy assisted tear analysis: A label free, optical approach for noninvasive disease diagnostics.

Experimental eye research·2024
Same author

Robust method to process nonuniform intensity holograms in digital holographic microscopy for nanoscale surface metrology.

Applied optics·2023
Same author

Deep learning assisted non-contact defect identification method using diffraction phase microscopy.

Applied optics·2023
Same author

Quantitative phase gradient metrology using diffraction phase microscopy and deep learning.

Journal of the Optical Society of America. A, Optics, image science, and vision·2023
Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026
Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026
Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026
Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026
Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026
Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026
See all related articles

Related Experiment Video

Updated: Dec 16, 2025

The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight
10:27

The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

Published on: October 11, 2016

9.8K

Dynamic noncontact surface profilometry using a fast eigenspace method in diffraction phase microscopy.

Sreeprasad Ajithaprasad, Jagadesh Ramaiah, Rajshekhar Gannavarpu

    Applied Optics
    |July 2, 2020
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces a new method using eigenspace analysis in diffraction phase microscopy for dynamic surface profiling in nondestructive testing. It enables fast, noncontact nanoscale measurements of surface topography, crucial for inspecting moving or large samples.

    More Related Videos

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
    10:12

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

    Published on: June 19, 2018

    9.4K
    High-speed Particle Image Velocimetry Near Surfaces
    11:59

    High-speed Particle Image Velocimetry Near Surfaces

    Published on: June 24, 2013

    33.6K

    Related Experiment Videos

    Last Updated: Dec 16, 2025

    The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight
    10:27

    The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

    Published on: October 11, 2016

    9.8K
    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
    10:12

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

    Published on: June 19, 2018

    9.4K
    High-speed Particle Image Velocimetry Near Surfaces
    11:59

    High-speed Particle Image Velocimetry Near Surfaces

    Published on: June 24, 2013

    33.6K

    Area of Science:

    • Optics and Photonics
    • Materials Science
    • Metrology

    Background:

    • Dynamic surface profile measurement is critical for nondestructive testing (NDT) of large or translating objects.
    • Existing methods may face limitations in speed and noncontact capabilities for dynamic metrology.
    • Accurate nanoscale topography is essential for quality control and material characterization.

    Purpose of the Study:

    • To propose and demonstrate an eigenspace signal analysis method for dynamic surface metrology using diffraction phase microscopy.
    • To integrate a graphics processing unit (GPU) computing framework for accelerated interferogram processing.
    • To enable reliable, noncontact, and fast nanoscale surface profiling for dynamic applications.

    Main Methods:

    • Application of eigenspace signal analysis within the framework of diffraction phase microscopy.
    • Development and implementation of a graphics processing unit (GPU) computing approach for rapid data processing.
    • Experimental validation using a test target for noninvasive nanoscale topography assessment.

    Main Results:

    • Successful implementation of eigenspace analysis for dynamic surface profile measurement.
    • Demonstration of significantly accelerated interferogram processing via GPU computing.
    • Achieved reliable noncontact nanoscale topography measurements of a test target.

    Conclusions:

    • The proposed eigenspace signal analysis method is effective for dynamic surface metrology.
    • GPU acceleration enhances the feasibility of real-time, dynamics-based surface investigations.
    • This technique offers a promising solution for noninvasive nanoscale inspection in NDT.