Imaging microstructural dynamics and strain fields in electro-active materials in situ with dark field x-ray

Jeppe Ormstrup1, Emil V Østergaard1, Carsten Detlefs2

  • 1Department of Physics, Technical University of Denmark, 2800 Kgs. Lyngby, Denmark.

Summary

New in situ dark field x-ray microscopy reveals unexpected domain growth and non-reversible strain in ferroelectric materials under electric fields and temperature changes. This advances understanding of structure-property relationships.