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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physical Chemistry

Background:

  • Liquid phase transmission electron microscopy (LPTEM) enables atomic-resolution studies in liquid environments.
  • Accurate quantification of sample thickness is essential for reliable LPTEM data interpretation, especially with thin liquid layers.
  • The log-ratio method using electron energy-loss spectroscopy (EELS) quantifies thickness relative to the inelastic mean free path (IMFP), which varies with material, electron energy, and optics.

Purpose of the Study:

  • To quantitatively analyze the IMFP of water as a function of EELS collection angle at 120 keV and 300 keV.
  • To refine theoretical models for water IMFP to improve accuracy in LPTEM and cryo-TEM.
  • To provide essential data for precise thickness determination in liquid and cryo-electron microscopy.

Main Methods:

  • Detailed quantitative analysis of water IMFP using EELS in a nanochannel liquid cell.
  • Measurements performed at electron energies of 120 keV and 300 keV.
  • Comparison of experimental results with established theoretical models and previous studies on ice.

Main Results:

  • Observed good agreement with IMFP values for ice in previous studies.
  • Found that widely used theoretical models significantly underestimate the IMFP of water.
  • Determined adjusted parameters (Em, water and θE, water) that enhance the accuracy of water IMFP calculations.

Conclusions:

  • The study provides a comprehensive understanding of the IMFP of water (or ice) under LPTEM conditions.
  • The refined parameters improve the accuracy of thickness measurements in LPTEM and cryo-TEM.
  • This work is vital for reliable interpretation and quantification of nanoscale processes in liquid environments.