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Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

14.5K
The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
14.5K
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

5.1K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
5.1K
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

6.6K
In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
6.6K
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

12.1K
Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...
12.1K
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

2.7K
Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
2.7K
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

12.7K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
12.7K

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Related Experiment Video

Updated: Dec 16, 2025

Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope
09:49

Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope

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Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing, and

Magnus Nord1,2, Robert W H Webster1, Kirsty A Paton1

  • 1SUPA, School of Physics and Astronomy, University of Glasgow, GlasgowG12 8QQ, UK.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|July 7, 2020
PubMed
Summary
This summary is machine-generated.

New direct electron detection technology enhances scanning transmission electron microscopy (STEM). Software solutions address hardware control and data management challenges, making advanced STEM more accessible.

Keywords:
4D STEMMedipix3fast pixelated detectorfile formatslive data processing

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Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
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Related Experiment Videos

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Area of Science:

  • Materials Science
  • Physics
  • Electron Microscopy

Background:

  • Fast pixelated detectors and direct electron detection are transforming scanning transmission electron microscopy (STEM).
  • Widespread adoption is hindered by technical challenges in hardware control, data acquisition, processing, visualization, and storage.
  • Addressing these challenges is crucial for leveraging advanced detector capabilities.

Purpose of the Study:

  • To present software solutions for technical challenges associated with new direct electron detectors in STEM.
  • To make the benefits of advanced detectors in STEM more accessible to researchers.
  • To facilitate the use and improvement of these technologies within the scientific community.

Main Methods:

  • Development of software solutions for hardware control, data acquisition, real-time processing, visualization, and storage.
  • Application of these solutions using data from a Medipix3 direct electron detector.
  • Open-sourcing most developed software to ensure transparency and community collaboration.

Main Results:

  • Demonstrated software solutions effectively address technical hurdles in using advanced STEM detectors.
  • Provided practical examples showcasing the application of new detectors and software.
  • Successfully made advanced STEM capabilities more accessible through user-friendly software.

Conclusions:

  • The developed software solutions overcome key obstacles in adopting new direct electron detectors for STEM.
  • Open-source availability promotes transparency, collaboration, and further innovation in electron microscopy.
  • These advancements will accelerate the integration of advanced detectors, enhancing STEM research capabilities.