AFM-Based High-Throughput Nanomechanical Screening of Single Extracellular Vesicles

Andrea Ridolfi1,2,3, Marco Brucale1,2, Costanza Montis1,3

  • 1Consorzio Interuniversitario per lo Sviluppo dei Sistemi a Grande Interfase, Via della Lastruccia 3, 50019 Firenze, Italy.

Summary

This study introduces a rapid atomic force microscopy method to analyze extracellular vesicle (EV) nanomechanics and morphology. The technique allows for high-throughput characterization, distinguishing EVs from contaminants and identifying subtypes based on mechanical properties.

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