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Updated: Dec 15, 2025

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
Published on: July 17, 2015
Jong Mok Ok1, Sangmoon Yoon1, Andrew R Lupini2
1Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
Epitaxial growth of copper chromium oxide (CuCrO2) delafossites on aluminum oxide substrates is achieved by forming a stable interfacial layer. This discovery aids in growing challenging noble-metal-based delafossite thin films.
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