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There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

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Hyperspectral Imaging as a Tool to Study Optical Anisotropy in Lanthanide-Based Molecular Single Crystals

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Published on: April 14, 2020

Hyperspectral imaging for dynamic thin film interferometry.

V Chandran Suja¹, J Sentmanat², G Hofmann³

¹Department of Chemical Engineering, Stanford University, Stanford, California, 94305, USA. vinny@stanford.edu.

Scientific Reports

|July 11, 2020

Summary

This summary is machine-generated.

This study introduces a new hyperspectral imaging method for automatically measuring the thickness of dynamic thin liquid films. The technique achieves high accuracy, overcoming previous limitations in automated film thickness determination.

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Area of Science:

Physics
Materials Science
Optical Engineering

Background:

Dynamic thin film interferometry is crucial for non-invasive characterization of evolving liquid films.
Automated and unconditional thickness recovery from interferograms remains a significant challenge.

Purpose of the Study:

To develop a compact setup and algorithms for automated determination of thin liquid film thickness profiles.
To enhance the accuracy and robustness of dynamic thin film characterization.

Main Methods:

Utilized a snapshot hyperspectral camera for capturing interferograms.
Developed algorithms for automated thickness profile reconstruction.
Employed dynamic thin film interferometry principles.

Main Results:

Achieved accuracy within 100 nm compared to manual color matching.
Demonstrated automated determination of thickness profiles for dynamic thin liquid films.
Showcased robustness against imaging noise.

Conclusions:

Hyperspectral interferometry offers an advanced solution for automated thin film thickness measurement.
The technique provides accurate and robust characterization without needing absolute light intensity data.