Nanomechanical mapping of soft materials with the atomic force microscope: methods, theory and applications

Ricardo Garcia1

  • 1Instituto de Ciencia de Materiales de Madrid, CSIC, c/Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain. r.garcia@csic.es.

Summary

This review covers advanced force microscopy techniques for high-resolution, non-destructive mapping of soft material properties. These nanomechanical mapping methods are crucial for materials science and understanding cell mechanics.