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Phase stepping through polarizing modulation in electronic speckle pattern interferometry.

Gustavo A Gómez-Méndez, Gustavo Rodríguez-Zurita, Amalia Martínez-García

|July 17, 2020

Summary

This summary is machine-generated.

A novel speckle interferometer uses polarization modulation for phase-stepping measurements. This system accurately quantifies out-of-plane displacement on surfaces like metal plates.

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Area of Science:

Optical Metrology
Interferometry
Surface Analysis

Background:

Speckle interferometry is a powerful technique for non-contact surface measurement.
Traditional phase-stepping methods can be complex to implement.
Controlling polarization states is crucial for precise phase analysis.

Purpose of the Study:

To demonstrate a speckle out-of-plane interferometer utilizing polarization modulation.
To implement phase-stepping procedures for enhanced measurement accuracy.
To measure out-of-plane displacement on a flat metal plate.

Main Methods:

A speckle interferometer was designed with polarization modulation.
Oppositely signed circular polarization states were generated in each arm.
Phase shifts were induced via a linear polarizer and analyzed.
A two-step algorithm was employed for phase-stepping.

Main Results:

The system successfully generated phase shifts through polarization modulation.
Analysis of emerging polarization states yielded necessary phase shifts.
Out-of-plane displacement was measured on a flat metal plate.

Conclusions:

The demonstrated interferometer effectively measures out-of-plane displacement.
Polarization modulation offers a viable method for phase-stepping in speckle interferometry.
The two-step algorithm provides accurate displacement measurements.