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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
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In IR spectroscopy, signals produced by the X−H bonds (such as C−H, O−H, or N−H) can be observed in the frequency range of  2700–4000 cm–1. The C−H stretching vibration forms sharp bands in the region 2850–3000 cm–1. The presence of the O−H stretching vibration leads to the forming of an absorption band in the frequency range 3650–3200 cm−1. At the same time, N−H stretching can be confirmed by absorption bands in...
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Double resonance techniques in Nuclear Magnetic Resonance (NMR) spectroscopy involve the simultaneous application of two different frequencies or radiofrequency pulses to manipulate and observe two distinct nuclear spins. One important application of double resonance is spin decoupling, which selectively suppresses coupling with one type of nucleus while observing the NMR signal from another nucleus, simplifying the spectrum and enhancing resolution.
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German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with...
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Possibility of X-ray pulse compression using an asymmetric or inclined double-crystal monochromator.

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Synthesis and Microdiffraction at Extreme Pressures and Temperatures
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X-ray pulse stretching after diffraction.

Jaromír Hrdý1

  • 1Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 18221 Praha 8, Czech Republic.

Journal of Applied Crystallography
|July 21, 2020
PubMed
Summary

Minimizing ultrashort X-ray pulse stretching during crystal diffraction is crucial. This study introduces a simplified model to predict pulse behavior and optimize experimental setups for shorter diffracted pulses.

Area of Science:

  • Physics
  • Optics
  • Materials Science

Background:

  • Ultrashort X-ray pulse sources demand optics that preserve minimal pulse duration.
  • Pulse stretching during crystal diffraction arises from pulse penetration and asymmetric diffraction geometry.
  • Existing theories for short X-ray pulse diffraction are complex, hindering prediction of pulse behavior in varied crystal arrangements.

Purpose of the Study:

  • To develop a simplified model for predicting ultrashort X-ray pulse behavior during crystal diffraction.
  • To identify optimal experimental configurations for minimizing pulse stretching.
  • To qualitatively assess pulse stretching effects from crystal penetration and asymmetric diffraction.

Main Methods:

  • Development of a simplified theoretical model for X-ray pulse diffraction.
Keywords:
X-ray pulse diffractionX-ray pulse stretchingshort X-ray pulses

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  • Analysis of pulse stretching due to penetration into crystal surfaces.
  • Prediction of pulse profile changes in symmetric and asymmetric two-crystal diffraction.
  • Main Results:

    • The proposed model qualitatively replicates pulse stretching observed in exact theories.
    • The model facilitates the identification of experimental arrangements that minimize pulse stretching.
    • Insights into pulse stretching mechanisms, including crystal penetration and asymmetric diffraction, are provided.

    Conclusions:

    • A simplified model offers a practical approach to understanding and mitigating ultrashort X-ray pulse stretching in crystal optics.
    • The findings guide the design of experimental setups for advanced X-ray sources.
    • Further research can refine the model for quantitative predictions in complex diffraction scenarios.