Equatorial aberration of powder diffraction data collected with an Si strip X-ray detector by a continuous-scan
1Advanced Ceramics Research Center, Nagoya Institute of Technology, Asahigaoka 10-6-29, Tajimi, Gifu 507-0071, Japan.
Abstract:
Exact and approximate mathematical formulas of equatorial aberration for powder diffraction data collected with an Si strip X-ray detector in continuous-scan integration mode are presented. An approximate formula is applied to treat the experimental data measured with a commercial powder diffractometer.
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