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Novel Decomposition Technique on Rational-Based Neuro-Transfer Function for Modeling of Microwave Components
Zhihao Zhao1,2, Feng Feng2, Jianan Zhang2
1School of Microelectronics, Tianjin University, Tianjin 300072, China.
This study introduces a decomposition technique to improve parametric modeling of microwave components using neuro-transfer functions (neuro-TFs). By breaking down high-order models into smaller ones, it reduces sensitivity and enhances accuracy.
Area of Science:
- Electromagnetics
- Microwave Engineering
- Computational Modeling
Background:
- Parametric modeling of electromagnetic (EM) behavior in microwave components is crucial.
- Rational-based neuro-transfer function (neuro-TF) methods are popular but suffer from high sensitivity issues with increasing model order.
- High sensitivity leads to training difficulties and reduced accuracy due to small coefficient errors causing large output errors.
Purpose of the Study:
- To address the high-sensitivity issue in high-order neuro-TF models.
- To propose a novel decomposition technique for improving the accuracy and trainability of neuro-TF models.
- To develop new formulations for determining sub-model parameters.
Main Methods:
- Decomposition of a high-order neuro-TF model into multiple lower-order sub-neuro-TF models.
- Reformulation of the overall model as a combination of these sub-models.
- Derivation of new formulations to determine the number of sub-models and their respective transfer function orders.
Main Results:
- The proposed decomposition technique significantly decreases the sensitivity of the model response to transfer function coefficients within each sub-model.
- This reduction in sensitivity leads to improved overall modeling accuracy.
- The method was demonstrated effectively on two electromagnetic (EM) parametric modeling examples.
Conclusions:
- The decomposition technique offers a viable solution to the high-sensitivity problem in neuro-TF modeling.
- This approach enhances the accuracy and robustness of parametric modeling for microwave components.
- The method provides a pathway for more reliable and precise EM behavior modeling.
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