Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Total Internal Reflection Fluorescence Microscopy

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Terahertz Frequency-Modulated Continuous-Wave Inspection of an Ancient Enamel Plate.

Sensors (Basel, Switzerland)·2025

Same author

Terahertz diffractive imaging with saturated data inpainting: publisher's note.

Optics letters·2025

Same author

Broadband THz emission of long pulses from photomixing process with optical chirped pulses.

Optics letters·2025

Same author

Terahertz diffractive imaging with saturated data inpainting.

Optics letters·2023

Same author

Noise analysis in a seeded four-wave mixing process generated in a photonic crystal fiber pumped by a chirped pulse.

Optics letters·2023

Same author

Terahertz Nondestructive Testing with Ultra-Wideband FMCW Radar.

Sensors (Basel, Switzerland)·2023

Search research articles

Related Experiment Video

Updated: Dec 13, 2025

A TIRF Microscopy Technique for Real-time, Simultaneous Imaging of the TCR and its Associated Signaling Proteins

A TIRF Microscopy Technique for Real-time, Simultaneous Imaging of the TCR and its Associated Signaling Proteins

Published on: March 22, 2012

A Versatile Illumination System for Real-Time Terahertz Imaging.

Jean-Baptiste Perraud¹, Adrien Chopard^1,2, Jean-Paul Guillet¹

¹IMS-Bordeaux University, UMR CNRS 5218, Bât A31, 351 Cours de la Libération, 33400 Talence, France.

Sensors (Basel, Switzerland)

|July 26, 2020

Summary

A new flexible terahertz illumination system uses fast beam steering to improve non-destructive testing images. This system enhances signal-to-noise ratio and suppresses interference for better real-time imaging applications.

Keywords:

illumination imaging lissajous microbolometer non-destructive-testing real-time terahertz tomography versatility

More Related Videos

High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip

High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip

Published on: November 16, 2019

$Femtosecond Laser Filaments for Use in Sub-Diffraction-Limited Imaging and Remote Sensing$

Femtosecond Laser Filaments for Use in Sub-Diffraction-Limited Imaging and Remote Sensing

Published on: April 25, 2019

Related Experiment Videos

Last Updated: Dec 13, 2025

A TIRF Microscopy Technique for Real-time, Simultaneous Imaging of the TCR and its Associated Signaling Proteins

A TIRF Microscopy Technique for Real-time, Simultaneous Imaging of the TCR and its Associated Signaling Proteins

Published on: March 22, 2012

High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip

High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip

Published on: November 16, 2019

$Femtosecond Laser Filaments for Use in Sub-Diffraction-Limited Imaging and Remote Sensing$

Femtosecond Laser Filaments for Use in Sub-Diffraction-Limited Imaging and Remote Sensing

Published on: April 25, 2019

Area of Science:

Optics and Photonics
Terahertz Science and Technology
Non-Destructive Testing

Background:

Terahertz (THz) technologies are gaining traction in industrial applications, especially for non-destructive testing (NDT).
Existing THz systems often lack compactness, integrability, and adaptability for real-world implementation.
Advancements in THz sources and detectors are paving the way for practical applications like real-time full-field imaging.

Purpose of the Study:

To develop and characterize a flexible illumination system for terahertz (THz) imaging.
To suppress coherence-length-induced interferences that degrade THz image quality.
To enhance the signal-to-noise ratio (SNR) for improved detector performance.

Main Methods:

Development of a flexible illumination system utilizing fast beam steering.
Characterization of the illumination system's performance.
Assessment of different illumination processes for versatility.

Main Results:

The developed system provides homogeneous and adjustable illumination.
It effectively suppresses unwanted interferences.
Optimized power distribution enhances the signal-to-noise ratio.

Conclusions:

The flexible illumination system enables optimum real-time imaging capabilities tailored to specific samples.
The system's versatility supports various industrial implementation scenarios.
This advancement facilitates the transition of THz technology towards practical, high-end industrial applications.