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Characterization of gap-plasmon based metasurfaces using scanning differential heterodyne microscopy
Ildar M Akhmedzhanov1, Rucha A Deshpande2, Dmitry V Baranov3
1Prokhorov General Physics Institute of the Russian Academy of Sciences, Vavilov str. 38, 119991, Moscow, Russia. eldar@kapella.gpi.ru.
Scientific Reports
|August 13, 2020
Summary
This study introduces scanning differential heterodyne microscopy (SDHM) for direct phase gradient measurement in optical metasurfaces. The technique accurately characterizes gap surface plasmon (GSP) metasurfaces, verifying their performance.
Area of Science:
- Optics and Photonics
- Metamaterials
- Plasmonics
Background:
- Optical metasurfaces offer subwavelength control over light's phase, amplitude, and polarization.
- Direct measurement of phase gradients in metasurfaces is challenging but crucial for their characterization.
- Gap surface plasmon (GSP) metasurfaces are a promising class of optical devices.
Purpose of the Study:
- To develop and validate a direct phase and amplitude characterization technique for optical metasurfaces.
- To assess the efficiency and accuracy of scanning differential heterodyne microscopy (SDHM) for this purpose.
- To experimentally characterize GSP metasurfaces using the developed SDHM approach.
Main Methods:
- Numerical simulations and experimental measurements were employed.
- Scanning differential heterodyne microscopy (SDHM) was utilized for direct phase and amplitude mapping.
- Two GSP metasurface configurations (binary grating and linear phase gradient) were analyzed at 633 nm.
Main Results:
- SDHM successfully performed direct phase and amplitude characterization of the GSP metasurfaces.
- Experimental performance of the metasurfaces was compared with SDHM-reconstructed phase and amplitude profiles.
- The study verified the efficiency and accuracy of SDHM for inspecting GSP reflective metasurfaces.
Conclusions:
- SDHM is an effective technique for the direct characterization of optical metasurfaces, particularly those based on GSP.
- The validated method allows for precise inspection of phase gradients and amplitude profiles.
- This work advances the metrology for optical metasurface development and application.

