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Effect of Multilayer versus Monolayer Dodecanethiol on Selectivity and Pattern Integrity in Area-Selective Atomic
Tzu-Ling Liu, Katie L Nardi1, Nerissa Draeger1
1Lam Research Corporation, Fremont, California 94538, United States.
ACS Applied Materials & Interfaces
|August 19, 2020
Summary
Multilayer dodecanethiols (DDT) more effectively block ZnO atomic layer deposition (ALD) than monolayers, while monolayer DDT better blocks Al2O3 ALD. Interfacial effects in area-selective ALD depend on DDT structure and precursor chemistry.
Area of Science:
- Materials Science
- Surface Chemistry
- Nanotechnology
Background:
- Area-selective atomic layer deposition (AS-ALD) is crucial for fabricating advanced microelectronic devices.
- Controlling surface chemistry with self-assembled monolayers (SAMs) is key to achieving selective growth.
- Dodecanethiols (DDT) on copper surfaces are investigated for their potential in AS-ALD.
Purpose of the Study:
- To compare the effectiveness of monolayer and multilayer DDT in blocking atomic layer deposition (ALD) on copper surfaces.
- To investigate the interfacial effects at Cu/SiO2 patterns during area-selective ALD (AS-ALD).
- To understand the influence of DDT layer structure and ALD precursor chemistry on AS-ALD performance.
Main Methods:
- Vapor phase assembly of monolayer and multilayer dodecanethiols (DDT) on copper surfaces.
- Atomic layer deposition (ALD) of ZnO and Al2O3 using different precursors (diethylzinc, trimethylaluminum, water).
- Characterization of interfacial effects and growth behavior on Cu/SiO2 patterns using scanning electron microscopy and other surface analysis techniques.
Main Results:
- Multilayer DDT is approximately 7 times more effective at blocking ZnO ALD than monolayer DDT.
- Monolayer DDT is more effective than multilayer DDT in blocking Al2O3 ALD.
- Interfacial effects, including gaps and nucleation delays, were observed for ZnO ALD on multilayer DDT-coated patterns, dependent on pitch size and ALD chemistry.
- Al2O3 ALD grew on the TaN diffusion barrier, while ZnO ALD did not, highlighting the dependence on ALD chemistry.
Conclusions:
- The structure of the DDT layer (monolayer vs. multilayer) significantly impacts its ability to block different ALD processes.
- ALD precursor chemistry plays a critical role in the success of AS-ALD, influencing growth on both the target surface and diffusion barriers.
- Tailoring both the self-assembled layer structure and ALD chemistry is essential for optimizing AS-ALD for microelectronic fabrication.

